X-Ray Diffractometer

  Instrument Details  
Specifications:
Make & Model : Model D8 Advance, M/s Bruker AXS, Germany

The broad specification of the XRD system is as given below:

S/n.Features/ParametersSpecification
1X-Ray generator Power3 kW
2X-Ray TubeCeramic
3Step Size± 0.0001 deg
4Sample TypePowder, Thin Films, Liquid
5Detector2D
6Goniometer Diameter600 mm
7High and Low Temperature Accessory-150° C to 450° C

  Working Principles   

        XRD system works on the Bragg’s Law. The diffraction process occurs when the Bragg’s law (condition) is satisfied.
        It is expressed as: n λ = 2d sin θ

         Where,
             λ is the wavelength of x-rays,
             d is the interplanar spacing,
             θ is the x-ray angle, and
             n is an integer.,


  Applications   
XRD is a non-destructive technique for extracting structural information from solid, liquid and thin film samples, regardless of shape, size or composition, under ambient or other atmospheric conditions. It is used to identify the crystalline phases and orientation of given substance. It is also used to determine the atomic arrangement, volume fractions of the phases and structural properties like strain grain size, phase composition, thermal expansion etc. XRD data consists of peak positions, intensities, oscillations and other shapes, which are unique to a specific sample. Using this data, one can deduce the sample properties in detail.
  Contact Person   

Dr. Amit L Sharma
Contact: 0172-2672407
0172-2672457
0172-2672487
Email Id : amitsharma_csio@csio.res.in



 Charges with GST Extra  

Rs. 1850Per sample