XRD is a non-destructive technique for extracting structural information from solid, liquid and thin film samples, regardless of shape, size or composition, under ambient or other atmospheric conditions. It is used to identify the crystalline phases and orientation of given substance. It is also used to determine the atomic arrangement, volume fractions of the phases and structural properties like strain grain size, phase composition, thermal expansion etc. XRD data consists of peak positions, intensities, oscillations and other shapes, which are unique to a specific sample. Using this data, one can deduce the sample properties in detail.