CSIR-CSIO
Analytical Instrument Facility

X-Ray Diffractometer

Instruments Details
Specifications:
Make & Model
:Model D8 Advance, M/s Bruker AXS, Germany
The broad specification of the XRD system is as given below:
S.No. Features/Parameters Specification
1.X-Ray generator Power3 kW
2.X-Ray TubeCeramic
3.Step Size± 0.0001 deg
4.Sample TypePowder, Thin Films, Liquid
5.Detector2D
6.Goniometer Diameter600 mm
7.High and Low Temperature Accessory-150° C to 450° C
Working Principles

XRD system works on the Bragg’s Law. The diffraction process occurs when the Bragg’s law (condition) is satisfied. It is expressed as: n λ = 2d sin θ.

Where,
λ is the wavelength of x-rays,
d is the interplanar spacing,
θ is the x-ray angle, and
n is an integer.,

Applications

XRD is a non-destructive technique for extracting structural information from solid, liquid and thin film samples, regardless of shape, size or composition, under ambient or other atmospheric conditions. It is used to identify the crystalline phases and orientation of given substance. It is also used to determine the atomic arrangement, volume fractions of the phases and structural properties like strain grain size, phase composition, thermal expansion etc. XRD data consists of peak positions, intensities, oscillations and other shapes, which are unique to a specific sample. Using this data, one can deduce the sample properties in detail.

Contact Person
Dr. Amit L Sharma
Contact: 0172-2672407, 0172-2672457, 0172-2672487
Email Id : amitsharma_csio@csio.res.in
Charges with GST Extra

Rs. 1850 Per sample


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