Analytical Instrument Facility
Make & Model
:Model D8 Advance, M/s Bruker AXS, Germany
The broad specification of the XRD system is as given below:
|1.||X-Ray generator Power||3 kW|
|3.||Step Size||± 0.0001 deg|
|4.||Sample Type||Powder, Thin Films, Liquid|
|6.||Goniometer Diameter||600 mm|
|7.||High and Low Temperature Accessory||-150° C to 450° C|
XRD system works on the Bragg’s Law. The diffraction process occurs when the Bragg’s law (condition) is satisfied.
It is expressed as: n λ = 2d sin θ.
λ is the wavelength of x-rays,
d is the interplanar spacing,
θ is the x-ray angle, and
n is an integer.,
XRD is a non-destructive technique for extracting structural information from solid, liquid and thin film samples, regardless of shape, size or composition, under ambient or other atmospheric conditions. It is used to identify the crystalline phases and orientation of given substance. It is also used to determine the atomic arrangement, volume fractions of the phases and structural properties like strain grain size, phase composition, thermal expansion etc. XRD data consists of peak positions, intensities, oscillations and other shapes, which are unique to a specific sample. Using this data, one can deduce the sample properties in detail.
Dr. Amit L Sharma
Contact: 0172-2672407, 0172-2672457, 0172-2672487
Email Id : firstname.lastname@example.org